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Ball inspection and repair equipment - List of Manufacturers, Suppliers, Companies and Products

Ball inspection and repair equipment Product List

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Wafer-Compatible Micro Ball Inspection Repair System BM-1150WR

Reliable solder ball repairs are performed by a repair unit that has accumulated unique image processing and proven results.

The BM-1120WR, developed alongside our micro ball mounter, has been highly regarded worldwide due to its CCD inspection system and reliable ball repair function, establishing itself as a best-selling model. Its successor, the BM-1150WR, combines accumulated image processing technology with a proven repair unit, achieving further improvements in mounting accuracy. 【Features】 ■ High-speed inspection of ball missing, excess balls, and pitch using a 12M camera Supports inspection of two types of balls with different diameters ■ Two types of repair support ・(a) Ball missing: Ball placement after applying flux ・(b) Excess balls: Removal by nozzle suction ■ Compatible with silicon wafers and molded wafers ■ Equipped with automatic calibration function ■ Supports SECS/GEM and AGV (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment

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Micro Ball Inspection Repair System for Substrates BM-2150SR

Reliable solder ball repair is performed using high-speed image processing and a uniquely developed repair unit.

A microball inspection and repair system capable of handling a wide range of sizes, from strip substrates to large panels. It also supports simultaneous inspection of two types of differently sized balls, assisting in achieving high implementation quality. 【Features】 ■ High-speed inspection of ball missing, excess balls, and pitch using an inspection camera (150Mx1) Supports inspection of two types of differently sized balls ■ Two types of repair support ・(a) Ball missing: Ball placement after applying flux ・(b) Excess balls: Removal by nozzle suction ■ An image processing system that follows the expansion of the C4 area due to the increase in package size ■ Compatible with SECS/GEM and AGV (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment

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